| 000 | 01223cam a2200301 a 4500 | ||
|---|---|---|---|
| 001 | 13050637 | ||
| 003 | OSt | ||
| 005 | 20231103113845.0 | ||
| 008 | 030107s2003 njua b 001 0 eng | ||
| 010 | _a 2003041100 | ||
| 020 | _a0471439959 | ||
| 040 |
_aDLC _cDLC _dDLC |
||
| 050 | 0 | 0 |
_aTK 7868 _b.D5M49 2003 |
| 082 | 0 | 0 |
_a621.3815/48 _221 |
| 100 | 1 | _aMiczo, Alexander. | |
| 245 | 1 | 0 |
_aDigital logic testing and simulation / _cAlexander Miczo. |
| 250 | _a2nd ed. | ||
| 260 |
_aHoboken, NJ : _bWiley-Interscience, _cc2003. |
||
| 300 |
_axxii, 668 p. : _bill. ; _c25 cm. |
||
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 |
_aDigital electronics _xTesting. |
|
| 856 | 4 | 2 |
_3Contributor biographical information _uhttp://www.loc.gov/catdir/bios/wiley046/2003041100.html |
| 856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/description/wiley039/2003041100.html |
| 856 | 4 | 1 |
_3Table of contents _uhttp://www.loc.gov/catdir/toc/wiley032/2003041100.html |
| 906 |
_a7 _bcbc _corignew _d1 _eocip _f20 _gy-gencatlg |
||
| 942 |
_2lcc _cLN _n0 |
||
| 999 |
_c68654 _d68654 |
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