000 | 00826cam a22002652 4500 | ||
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999 |
_c30595 _d30595 |
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001 | 013089149 | ||
003 | UkOxU | ||
005 | 20200226104611.0 | ||
008 | 740625s1967 nyua b 000 0 eng | ||
010 | _a66028633 | ||
015 | _aGB67-24704 | ||
035 | _aOCLC ocm02118269 from D970912M | ||
040 |
_aDLC _cDLC _dOCL _dUKM _dEQO |
||
050 | 0 |
_aQC 100.5 _b.N3 1985 |
|
082 | _a621.3817 | ||
100 |
_aNakra, B . C _95696 |
||
245 | 1 | 0 |
_aInstrumentation measurement and analysis/ _c[by] B.C Nakra, K K Chaudhry. |
260 |
_aNew York : _bMcGraw-Hill, _c1967 |
||
300 |
_ax, 340 pages. _billusustrations. _c26 cm. |
||
504 | _aIncludes bibliographical references and index. | ||
650 | 0 | _aIntegrated circuits. | |
700 |
_95701 _aK K Chaudhry |
||
942 |
_2lcc _cBK |