000 01126pam a2200289 a 4500
999 _c26353
_d26353
001 4395378
003 OSt
005 20200207101118.0
008 920422s1993 enkaf b 001 0 eng
010 _a 92016263
020 _a0521419565
040 _aDLC
_cDLC
_dDLC
050 0 0 _aQD 117
_b.E42R43 1993
082 0 0 _a543/.08586
_220
100 1 _aReed, S. J. B.
245 1 0 _aElectron microprobe analysis /
_cS.J.B. Reed.
250 _a2nd ed.
260 _aCambridge [England] ;
_aNew York, NY, USA :
_bCambridge University Press,
_c1993.
300 _axviii, 326 p., 3 p. of plates :
_bill. (some col.) ;
504 _aIncludes bibliographical references (p. 306-318) and index.
650 0 _aMicroprobe analysis.
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/description/cam025/92016263.html
856 4 1 _3Table of contents
_uhttp://www.loc.gov/catdir/toc/cam021/92016263.html
906 _a7
_bcbc
_corignew
_d1
_eocip
_f19
_gy-gencatlg
942 _2lcc
_cBK