000 | 01126pam a2200289 a 4500 | ||
---|---|---|---|
999 |
_c26353 _d26353 |
||
001 | 4395378 | ||
003 | OSt | ||
005 | 20200207101118.0 | ||
008 | 920422s1993 enkaf b 001 0 eng | ||
010 | _a 92016263 | ||
020 | _a0521419565 | ||
040 |
_aDLC _cDLC _dDLC |
||
050 | 0 | 0 |
_aQD 117 _b.E42R43 1993 |
082 | 0 | 0 |
_a543/.08586 _220 |
100 | 1 | _aReed, S. J. B. | |
245 | 1 | 0 |
_aElectron microprobe analysis / _cS.J.B. Reed. |
250 | _a2nd ed. | ||
260 |
_aCambridge [England] ; _aNew York, NY, USA : _bCambridge University Press, _c1993. |
||
300 |
_axviii, 326 p., 3 p. of plates : _bill. (some col.) ; |
||
504 | _aIncludes bibliographical references (p. 306-318) and index. | ||
650 | 0 | _aMicroprobe analysis. | |
856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/description/cam025/92016263.html |
856 | 4 | 1 |
_3Table of contents _uhttp://www.loc.gov/catdir/toc/cam021/92016263.html |
906 |
_a7 _bcbc _corignew _d1 _eocip _f19 _gy-gencatlg |
||
942 |
_2lcc _cBK |