Logic testing and design for testability / Hideo Fujiwara.

By:

Material type: Text

TextSeries: MIT Press series in computer systemsPublication details: Cambridge, Mass. : MIT Press, c1985.Description: x, 284 p. : ill. ; 24 cmISBN:

Subject(s):

DDC classification:

LOC classification:

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Call number	Status	Barcode
Loan	Margaret Thatcher Library Second Floor	TK 7868 .L6F8 1985 (Browse shelf(Opens below))	Available	10060479

Includes index.

Bibliography: p. [272]-278.

There are no comments on this title.

to post a comment.