TY  - BOOK
AU  - Fujiwara,Hideo
TI  - Logic testing and design for testability
SN  - 0262060965
AV  - TK7868.L6 F85 1985
U1  - 621.3815/37 19
PY  - 1985///
CY  - Cambridge, Mass.
PB  - MIT Press
KW  - Logic circuits
KW  - Testing
N1  - Includes index; Bibliography: p. [272]-278
ER  -