Fujiwara, Hideo. <br/><br/>
Logic testing and design for testability / 
Hideo Fujiwara. 
 - Cambridge, Mass. :  MIT Press,  c1985. 
 - x, 284 p. :  ill. ;  24 cm. 
 - MIT Press series in computer systems .
<br/><br/> Includes index. 
<br/><br/>Bibliography: p. [272]-278. 
<br/><br/><label>ISBN: </label>0262060965 
<br/><br/><label>LCCN: </label>85000084  
<br/><br/><label>Subjects--Topical Terms: </label><br/>Logic circuits--Testing.
<br/><br/><label>LC Class. No.: </label>TK7868.L6  / F85 1985 
<br/><br/><label>Dewey Class. No.: </label>621.3815/37