TY  - BOOK
AU  - Miczo,Alexander
TI  - Digital logic testing and simulation
SN  - 0471439959
AV  - TK 7868 .D5M49 2003
U1  - 621.3815/48 21
PY  - 2003///
CY  - Hoboken, NJ
PB  - Wiley-Interscience
KW  - Digital electronics
KW  - Testing
N1  - Includes bibliographical references and index
UR  - http://www.loc.gov/catdir/bios/wiley046/2003041100.html
UR  - http://www.loc.gov/catdir/description/wiley039/2003041100.html
UR  - http://www.loc.gov/catdir/toc/wiley032/2003041100.html
ER  -