Defect recognition in semiconductors before and after processing : proceedings of the fourth International Conference, Wilmslow, UK, 18-22 March, 1991 / edited by M.R. Brozel, D.J. Stirland.

By:

Contributor(s):

Material type: Text

TextPublication details: Bristol, England ; Philadelphia : Adam Hilger, c1992.Description: 310 p. : ill. (some col.) ; 31 cmISBN:

Subject(s):

DDC classification:

LOC classification:

Online resources:

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Call number	Status	Barcode
Loan	Margaret Thatcher Library Second Floor	TK 7871.85 .I5825 1991 (Browse shelf(Opens below))	Available	10058159
Loan	Margaret Thatcher Library Second Floor	TK 7871.85 .I5825 1991 (Browse shelf(Opens below))	Available	10058160

Browsing Margaret Thatcher Library shelves,Shelving location: Second Floor Close shelf browser (Hides shelf browser)

Previous								Next
Previous	TK 7871.85 .B67 2000 Semiconductor devices using Electronics Workbench /	TK 7871.85.B83 1992 Photoelectronic properties of semiconductors /	TK 7871.85.B83 1992 Photoelectronic properties of semiconductors /	TK 7871.85 .I5825 1991 Defect recognition in semiconductors before and after processing : proceedings of the fourth International Conference, Wilmslow, UK, 18-22 March, 1991 /	TK 7871.85 .I5825 1991 Defect recognition in semiconductors before and after processing : proceedings of the fourth International Conference, Wilmslow, UK, 18-22 March, 1991 /	TK 7871.85 .L38 1989 Microelectronic devices /	TK 7871.85 .L38 1989 Microelectronic devices /	Next

Includes bibliographical references.

There are no comments on this title.

to post a comment.