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Logic testing and design for testability / Hideo Fujiwara.
Material type:
TextSeries: MIT Press series in computer systemsPublication details: Cambridge, Mass. : MIT Press, c1985.Description: x, 284 p. : ill. ; 24 cmISBN: - 0262060965
- 621.3815/37Â 19
- TK7868.L6Â F85 1985
| Item type | Current library | Call number | Status | Barcode | |
|---|---|---|---|---|---|
| Loan | Margaret Thatcher Library Second Floor | TK 7868 .L6F8 1985 (Browse shelf(Opens below)) | Available | 10060479 |
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| TK 7868 .L6B76 2003 Fundamentals of digital logic with Verilog design : custom publication for university of Toronto / | TK 7868.L6B76 2003 Fundamentals of digital logic with VHDL design / | TK 7868.L6B76 2003 Fundamentals of digital logic with VHDL design / | TK 7868 .L6F8 1985 Logic testing and design for testability / | TK 7868 .L6L626 1984 Logic minimization algorithms for VLSI synthesis / | TK 7868 .L6M35 2002 Introduction to logic design / | TK 7868 .L6M35 2002 Introduction to logic design / |
Includes index.
Bibliography: p. [272]-278.
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