Applied logistic regression / David W. Hosmer, Jr., Stanley Lemeshow.

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Material type: Text

TextSeries: Wiley series in probability and mathematical statistics. Applied probability and statisticsPublication details: New York : Wiley, c1989.Description: xiii, 307 pagesISBN:

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Holdings
Item type	Current library	Call number	Status	Barcode
Loan	Margaret Thatcher Library Second Floor	QA 278.2 .H67 1989 (Browse shelf(Opens below))	Available	23010025

"A Wiley-Interscience publication."

Includes bibliographical references (p. 291-300) and index.

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