Logic testing and design for testability /
Fujiwara, Hideo.
Logic testing and design for testability / Hideo Fujiwara. - Cambridge, Mass. : MIT Press, c1985. - x, 284 p. : ill. ; 24 cm. - MIT Press series in computer systems .
Includes index.
Bibliography: p. [272]-278.
0262060965
85000084
Logic circuits--Testing.
TK7868.L6 / F85 1985
621.3815/37
Logic testing and design for testability / Hideo Fujiwara. - Cambridge, Mass. : MIT Press, c1985. - x, 284 p. : ill. ; 24 cm. - MIT Press series in computer systems .
Includes index.
Bibliography: p. [272]-278.
0262060965
85000084
Logic circuits--Testing.
TK7868.L6 / F85 1985
621.3815/37